Belle II Software  release-05-02-19
ARICHModuleTest.h
1 /**************************************************************************
2  * BASF2 (Belle Analysis Framework 2) *
3  * Copyright(C) 2015 - Belle II Collaboration *
4  * *
5  * Author: The Belle II Collaboration *
6  * Contributors: Manca Mrvar *
7  * *
8  * This software is provided "as is" without any warranty. *
9  **************************************************************************/
10 
11 #pragma once
12 
13 #include <TObject.h>
14 #include <string>
15 #include <vector>
16 #include <TH1D.h>
17 #include <TH2D.h>
18 #include <TGraph.h>
19 
20 #include <TClass.h>
21 
22 namespace Belle2 {
32  class ARICHModuleTest: public TObject {
33  public:
34 
39  m_guardBias_th(NULL), m_HV_th(NULL), m_guardBias_2Dx(NULL), m_HV_2Dx(NULL), m_guardBias_2Dy(NULL), m_HV_2Dy(NULL), m_gain(NULL),
40  m_charge(NULL), m_th(NULL), m_scanX(NULL), m_scanY(NULL), m_comment("")
41  {
42  for (unsigned i = 0; i < 4; i++) m_chipVdiff_th[i] = NULL;
43  for (unsigned i = 0; i < 4; i++) m_chipLeak_th[i] = NULL;
44  for (unsigned i = 0; i < 4; i++) m_chipVdiff_2Dx[i] = NULL;
45  for (unsigned i = 0; i < 4; i++) m_chipLeak_2Dx[i] = NULL;
46  for (unsigned i = 0; i < 4; i++) m_chipVdiff_2Dy[i] = NULL;
47  for (unsigned i = 0; i < 4; i++) m_chipLeak_2Dy[i] = NULL;
48  };
49 
53  ~ARICHModuleTest() {};
54 
58  int getFebSN() const {return m_febSN; }
59 
63  void setFebSN(int serial) {m_febSN = serial; }
64 
68  std::string getHapdSN() const {return m_hapdSN; }
69 
73  void setHapdSN(const std::string& hapd) {m_hapdSN = hapd; }
74 
78  int getHvbSN() const {return m_hvbSN; }
79 
83  void setHvbSN(int serial) {m_hvbSN = serial; }
84 
88  int getRun() const {return m_run; }
89 
93  void setRun(int run) {m_run = run; }
94 
98  int getRunPosition() const {return m_runposition; }
99 
103  void setRunPosition(int runposition) {m_runposition = runposition; }
104 
108  bool getOK() const {return m_isOK; }
109 
113  void setOK(bool isOK) {m_isOK = isOK; }
114 
120  int getDeadCh(unsigned int i) const;
121 
126  void appendDeadCh(int channel) {m_deadCh.push_back(channel); }
127 
132  void setDeadChs(const std::vector<int>& deadChs) {m_deadCh = deadChs; }
133 
138  int getDeadChsSize() const {return m_deadCh.size();}
139 
145  int getStrangeCh(unsigned int i) const;
146 
151  void appendStrangeCh(int channel) {m_strangeCh.push_back(channel); }
152 
157  void setStrangeChs(const std::vector<int>& strangeChs) {m_strangeCh = strangeChs; }
158 
163  int getStrangeChsSize() const {return m_strangeCh.size();}
164 
169  TGraph* getGuardBiasTH() const {return m_guardBias_th;}
170 
175  void setGuardBiasTH(TGraph* guardBias_th) { m_guardBias_th = guardBias_th;}
176 
180  TGraph* getChipVdiffTH(unsigned int i) const;
181 
185  void setChipVdiffTH(unsigned int i, TGraph* chipVdiff_th);
186 
190  TGraph* getChipLeakTH(unsigned int i) const;
191 
195  void setChipLeakTH(unsigned int i, TGraph* chipLeak_th);
196 
201  TGraph* getHighVoltageTH() const {return m_HV_th;}
202 
207  void setHighVoltageTH(TGraph* HV_th) { m_HV_th = HV_th;}
208 
213  TGraph* getGuardBias2Dx() const {return m_guardBias_2Dx;}
214 
219  void setGuardBias2Dx(TGraph* guardBias_2Dx) { m_guardBias_2Dx = guardBias_2Dx;}
220 
224  TGraph* getChipVdiff2Dx(unsigned int i) const;
225 
229  void setChipVdiff2Dx(unsigned int i, TGraph* chipVdiff_2Dx);
230 
234  TGraph* getChipLeak2Dx(unsigned int i) const;
235 
239  void setChipLeak2Dx(unsigned int i, TGraph* chipLeak_2Dx);
240 
245  TGraph* getHighVoltage2Dx() const {return m_HV_2Dx;}
246 
251  void setHighVoltage2Dx(TGraph* HV_2Dx) { m_HV_2Dx = HV_2Dx;}
252 
257  TGraph* getGuardBias2Dy() const {return m_guardBias_2Dy;}
258 
262  TGraph* getChipVdiff2Dy(unsigned int i) const;
263 
267  void setChipVdiff2Dy(unsigned int i, TGraph* chipVdiff_2Dy);
268 
273  void setGuardBias2Dy(TGraph* guardBias_2Dy) { m_guardBias_2Dy = guardBias_2Dy;}
274 
278  TGraph* getChipLeak2Dy(unsigned int i) const;
279 
283  void setChipLeak2Dy(unsigned int i, TGraph* chipLeak_2Dy);
284 
289  TGraph* getHighVoltage2Dy() const {return m_HV_2Dy;}
290 
295  void setHighVoltage2Dy(TGraph* HV_2Dy) { m_HV_2Dy = HV_2Dy;}
296 
301  TH1F* getGain() const {return m_gain;}
302 
307  void setGain(TH1F* gain) { m_gain = gain;}
308 
313  TH2D* getChargeScan() const {return m_charge;}
314 
319  void setChargeScan(TH2D* charge) { m_charge = charge;}
320 
325  TH2D* getTresholdScan() const {return m_th;}
326 
331  void setTresholdScan(TH2D* th) { m_th = th;}
332 
337  TH2D* getLaserScanX() const {return m_scanX;}
338 
343  void setLaserScanX(TH2D* scanX) { m_scanX = scanX;}
344 
349  TH2D* getLaserScanY() const {return m_scanY;}
350 
355  void setLaserScanY(TH2D* scanY) { m_scanY = scanY;}
356 
360  void setComment(const std::string& comment) {m_comment = comment; }
361 
365  std::string getComment() const {return m_comment; }
366 
367  private:
368 
369  int m_febSN;
370  std::string m_hapdSN;
371  int m_hvbSN;
372  int m_run;
374  bool m_isOK;
375  std::vector<int> m_deadCh;
376  std::vector<int> m_strangeCh;
378  TGraph* m_guardBias_th;
379  TGraph* m_chipVdiff_th[4];
380  TGraph* m_chipLeak_th[4];
381  TGraph* m_HV_th;
382  TGraph* m_guardBias_2Dx;
383  TGraph* m_chipVdiff_2Dx[4];
384  TGraph* m_chipLeak_2Dx[4];
385  TGraph* m_HV_2Dx;
386  TGraph* m_guardBias_2Dy;
387  TGraph* m_chipVdiff_2Dy[4];
388  TGraph* m_chipLeak_2Dy[4];
389  TGraph* m_HV_2Dy;
390  TH1F* m_gain;
391  TH2D* m_charge;
392  TH2D* m_th;
393  TH2D* m_scanX;
394  TH2D* m_scanY;
396  std::string m_comment;
399  };
401 } // end namespace Belle2
Belle2::EvtPDLUtil::charge
double charge(int pdgCode)
Returns electric charge of a particle with given pdg code.
Definition: EvtPDLUtil.cc:46
Belle2::ARICHModuleTest::setChipVdiffTH
void setChipVdiffTH(unsigned int i, TGraph *chipVdiff_th)
Set Chip Vmon - Vset difference during treshold scan.
Definition: ARICHModuleTest.cc:34
Belle2::ARICHModuleTest::m_gain
TH1F * m_gain
Gain for each channel.
Definition: ARICHModuleTest.h:398
Belle2::ARICHModuleTest::setChipLeakTH
void setChipLeakTH(unsigned int i, TGraph *chipLeak_th)
Set leakage current during treshold scan.
Definition: ARICHModuleTest.cc:45
Belle2::ARICHModuleTest::m_HV_2Dy
TGraph * m_HV_2Dy
High voltage during 2D y scan.
Definition: ARICHModuleTest.h:397
Belle2::ARICHModuleTest::setChipVdiff2Dy
void setChipVdiff2Dy(unsigned int i, TGraph *chipVdiff_2Dy)
Set Chip Vmon - Vset difference during 2Dx scan.
Definition: ARICHModuleTest.cc:78
Belle2::hapd
TH1F * hapd[6]
histogram of hits for each hapd
Definition: arichBtestModule.cc:86
Belle2::ARICHModuleTest::m_isOK
bool m_isOK
Module is OK if true.
Definition: ARICHModuleTest.h:382
Belle2::ARICHModuleTest::getHapdSN
std::string getHapdSN() const
Return HAPD serial number.
Definition: ARICHModuleTest.h:76
Belle2::ARICHModuleTest::setComment
void setComment(const std::string &comment)
Set comment.
Definition: ARICHModuleTest.h:368
Belle2::ARICHModuleTest::setGuardBiasTH
void setGuardBiasTH(TGraph *guardBias_th)
Set guard bias during treshold scan.
Definition: ARICHModuleTest.h:183
Belle2::ARICHModuleTest::getStrangeChsSize
int getStrangeChsSize() const
Return size of the list of strange channels.
Definition: ARICHModuleTest.h:171
Belle2::ARICHModuleTest::m_chipVdiff_th
TGraph * m_chipVdiff_th[4]
Chip Vmon - Vset difference during treshold scan.
Definition: ARICHModuleTest.h:387
Belle2::ARICHModuleTest::getFebSN
int getFebSN() const
Return FEB serial number.
Definition: ARICHModuleTest.h:66
Belle2::ARICHModuleTest::m_chipLeak_2Dy
TGraph * m_chipLeak_2Dy[4]
Chip leakage current during 2D y scan.
Definition: ARICHModuleTest.h:396
Belle2::ARICHModuleTest::setHighVoltage2Dy
void setHighVoltage2Dy(TGraph *HV_2Dy)
Set high voltage during 2Dy scan.
Definition: ARICHModuleTest.h:303
Belle2::ARICHModuleTest::m_comment
std::string m_comment
Optional comment.
Definition: ARICHModuleTest.h:404
Belle2::ARICHModuleTest::m_febSN
int m_febSN
FEB serial number.
Definition: ARICHModuleTest.h:377
Belle2::ARICHModuleTest::m_hvbSN
int m_hvbSN
HVB serial number.
Definition: ARICHModuleTest.h:379
Belle2::ARICHModuleTest::setOK
void setOK(bool isOK)
Set bool value - module is OK.
Definition: ARICHModuleTest.h:121
Belle2::ARICHModuleTest::setHighVoltageTH
void setHighVoltageTH(TGraph *HV_th)
Set high voltage during treshold scan.
Definition: ARICHModuleTest.h:215
Belle2::ARICHModuleTest::getChipLeak2Dy
TGraph * getChipLeak2Dy(unsigned int i) const
Get leakage current during 2Dy scan.
Definition: ARICHModuleTest.cc:83
Belle2::ARICHModuleTest::setRunPosition
void setRunPosition(int runposition)
Set module test run.
Definition: ARICHModuleTest.h:111
Belle2::ARICHModuleTest::getGuardBiasTH
TGraph * getGuardBiasTH() const
Return guard bias during treshold scan.
Definition: ARICHModuleTest.h:177
Belle2::ARICHModuleTest::setHvbSN
void setHvbSN(int serial)
Set HVB serial number.
Definition: ARICHModuleTest.h:91
Belle2::ARICHModuleTest
The Class for ARICH Aerogel Parameters.
Definition: ARICHModuleTest.h:40
Belle2::ARICHModuleTest::getDeadChsSize
int getDeadChsSize() const
Return size of the list of dead channels.
Definition: ARICHModuleTest.h:146
Belle2::ARICHModuleTest::getRunPosition
int getRunPosition() const
Return module test run position.
Definition: ARICHModuleTest.h:106
Belle2::ARICHModuleTest::getHighVoltage2Dx
TGraph * getHighVoltage2Dx() const
Return high voltage during 2Dx scan.
Definition: ARICHModuleTest.h:253
Belle2::ARICHModuleTest::getGuardBias2Dy
TGraph * getGuardBias2Dy() const
Return guard bias during 2Dy scan.
Definition: ARICHModuleTest.h:265
Belle2::ARICHModuleTest::setGuardBias2Dx
void setGuardBias2Dx(TGraph *guardBias_2Dx)
Set guard bias during 2Dx scan.
Definition: ARICHModuleTest.h:227
Belle2::ARICHModuleTest::m_chipVdiff_2Dy
TGraph * m_chipVdiff_2Dy[4]
Chip Vmon - Vset difference during 2D y scan.
Definition: ARICHModuleTest.h:395
Belle2::ARICHModuleTest::m_chipLeak_2Dx
TGraph * m_chipLeak_2Dx[4]
Chip leakage current during 2D x scan.
Definition: ARICHModuleTest.h:392
Belle2::ARICHModuleTest::m_charge
TH2D * m_charge
Charge scan 2D.
Definition: ARICHModuleTest.h:399
Belle2::ARICHModuleTest::~ARICHModuleTest
~ARICHModuleTest()
Destructor.
Definition: ARICHModuleTest.h:61
Belle2::ARICHModuleTest::getHvbSN
int getHvbSN() const
Return HVB serial number.
Definition: ARICHModuleTest.h:86
Belle2::ARICHModuleTest::m_HV_2Dx
TGraph * m_HV_2Dx
High voltage during 2D x scan.
Definition: ARICHModuleTest.h:393
Belle2::ARICHModuleTest::getChargeScan
TH2D * getChargeScan() const
Return charge scan.
Definition: ARICHModuleTest.h:321
Belle2::ARICHModuleTest::appendDeadCh
void appendDeadCh(int channel)
Add a channel number to the list of dead channels.
Definition: ARICHModuleTest.h:134
Belle2::ARICHModuleTest::getHighVoltage2Dy
TGraph * getHighVoltage2Dy() const
Return high voltage during 2Dy scan.
Definition: ARICHModuleTest.h:297
Belle2::ARICHModuleTest::m_HV_th
TGraph * m_HV_th
High voltage during treshold scan.
Definition: ARICHModuleTest.h:389
Belle2::ARICHModuleTest::getOK
bool getOK() const
Return True if module is OK.
Definition: ARICHModuleTest.h:116
Belle2::ARICHModuleTest::m_scanY
TH2D * m_scanY
Laser scan 2D - y direction.
Definition: ARICHModuleTest.h:402
Belle2::ARICHModuleTest::m_chipVdiff_2Dx
TGraph * m_chipVdiff_2Dx[4]
Chip Vmon - Vset difference during 2D x scan.
Definition: ARICHModuleTest.h:391
Belle2
Abstract base class for different kinds of events.
Definition: MillepedeAlgorithm.h:19
Belle2::ARICHModuleTest::m_deadCh
std::vector< int > m_deadCh
List of dead channels (mapping: channels on HAPD)
Definition: ARICHModuleTest.h:383
Belle2::ARICHModuleTest::m_strangeCh
std::vector< int > m_strangeCh
List of strange channels (mapping: channels on HAPD)
Definition: ARICHModuleTest.h:384
Belle2::ARICHModuleTest::getGuardBias2Dx
TGraph * getGuardBias2Dx() const
Return guard bias during 2Dx scan.
Definition: ARICHModuleTest.h:221
Belle2::ARICHModuleTest::setLaserScanY
void setLaserScanY(TH2D *scanY)
Set laser scan - Y direction.
Definition: ARICHModuleTest.h:363
Belle2::ARICHModuleTest::setChipLeak2Dx
void setChipLeak2Dx(unsigned int i, TGraph *chipLeak_2Dx)
Set leakage current during 2Dx scan.
Definition: ARICHModuleTest.cc:67
Belle2::ARICHModuleTest::m_hapdSN
std::string m_hapdSN
HAPD serial number.
Definition: ARICHModuleTest.h:378
Belle2::ARICHModuleTest::setTresholdScan
void setTresholdScan(TH2D *th)
Set treshold scan.
Definition: ARICHModuleTest.h:339
Belle2::ARICHModuleTest::m_runposition
int m_runposition
Position on setup.
Definition: ARICHModuleTest.h:381
Belle2::ARICHModuleTest::setGuardBias2Dy
void setGuardBias2Dy(TGraph *guardBias_2Dy)
Set guard bias during 2Dy scan.
Definition: ARICHModuleTest.h:281
Belle2::ARICHModuleTest::setChargeScan
void setChargeScan(TH2D *charge)
Set charge scan.
Definition: ARICHModuleTest.h:327
Belle2::ARICHModuleTest::getChipLeakTH
TGraph * getChipLeakTH(unsigned int i) const
Get leakage current during treshold scan.
Definition: ARICHModuleTest.cc:39
Belle2::ARICHModuleTest::getTresholdScan
TH2D * getTresholdScan() const
Return treshold scan.
Definition: ARICHModuleTest.h:333
Belle2::ARICHModuleTest::getGain
TH1F * getGain() const
Return gain.
Definition: ARICHModuleTest.h:309
Belle2::ARICHModuleTest::getStrangeCh
int getStrangeCh(unsigned int i) const
Return a channel number from the list of strange channels.
Definition: ARICHModuleTest.cc:22
Belle2::ARICHModuleTest::ARICHModuleTest
ARICHModuleTest()
Default constructor.
Definition: ARICHModuleTest.h:46
Belle2::ARICHModuleTest::setGain
void setGain(TH1F *gain)
Set gain.
Definition: ARICHModuleTest.h:315
Belle2::ARICHModuleTest::getLaserScanY
TH2D * getLaserScanY() const
Return laser scan - Y direction.
Definition: ARICHModuleTest.h:357
Belle2::ARICHModuleTest::setFebSN
void setFebSN(int serial)
Set FEB serial number.
Definition: ARICHModuleTest.h:71
Belle2::ARICHModuleTest::getLaserScanX
TH2D * getLaserScanX() const
Return laser scan - X direction.
Definition: ARICHModuleTest.h:345
Belle2::ARICHModuleTest::setHapdSN
void setHapdSN(const std::string &hapd)
Set HAPD serial number.
Definition: ARICHModuleTest.h:81
Belle2::ARICHModuleTest::getComment
std::string getComment() const
Return comment.
Definition: ARICHModuleTest.h:373
Belle2::ARICHModuleTest::getRun
int getRun() const
Return module test run.
Definition: ARICHModuleTest.h:96
Belle2::ARICHModuleTest::m_guardBias_2Dy
TGraph * m_guardBias_2Dy
Guard bias during 2D y scan.
Definition: ARICHModuleTest.h:394
Belle2::ARICHModuleTest::m_guardBias_th
TGraph * m_guardBias_th
Guard bias during treshold scan.
Definition: ARICHModuleTest.h:386
Belle2::ARICHModuleTest::setChipLeak2Dy
void setChipLeak2Dy(unsigned int i, TGraph *chipLeak_2Dy)
Set leakage current during 2Dy scan.
Definition: ARICHModuleTest.cc:89
Belle2::ARICHModuleTest::getHighVoltageTH
TGraph * getHighVoltageTH() const
Return high voltage during treshold scan.
Definition: ARICHModuleTest.h:209
Belle2::ARICHModuleTest::setRun
void setRun(int run)
Set module test run.
Definition: ARICHModuleTest.h:101
Belle2::ARICHModuleTest::setLaserScanX
void setLaserScanX(TH2D *scanX)
Set laser scan - X direction.
Definition: ARICHModuleTest.h:351
Belle2::ARICHModuleTest::appendStrangeCh
void appendStrangeCh(int channel)
Add a channel number to the list of strange channels.
Definition: ARICHModuleTest.h:159
Belle2::ARICHModuleTest::m_run
int m_run
Run number.
Definition: ARICHModuleTest.h:380
Belle2::ARICHModuleTest::ClassDef
ClassDef(ARICHModuleTest, 2)
ClassDef.
Belle2::ARICHModuleTest::getChipVdiffTH
TGraph * getChipVdiffTH(unsigned int i) const
Get Chip Vmon - Vset difference during treshold scan.
Definition: ARICHModuleTest.cc:28
Belle2::ARICHModuleTest::m_guardBias_2Dx
TGraph * m_guardBias_2Dx
Guard bias during 2D x scan.
Definition: ARICHModuleTest.h:390
Belle2::ARICHModuleTest::setStrangeChs
void setStrangeChs(const std::vector< int > &strangeChs)
Set vector of strange channel numbers.
Definition: ARICHModuleTest.h:165
Belle2::ARICHModuleTest::getChipVdiff2Dy
TGraph * getChipVdiff2Dy(unsigned int i) const
Get Chip Vmon - Vset difference during 2Dy scan.
Definition: ARICHModuleTest.cc:72
Belle2::ARICHModuleTest::m_th
TH2D * m_th
Treshold scan 2D.
Definition: ARICHModuleTest.h:400
Belle2::ARICHModuleTest::setChipVdiff2Dx
void setChipVdiff2Dx(unsigned int i, TGraph *chipVdiff_2Dx)
Set Chip Vmon - Vset difference during 2Dx scan.
Definition: ARICHModuleTest.cc:56
Belle2::ARICHModuleTest::m_chipLeak_th
TGraph * m_chipLeak_th[4]
Chip leakage current during treshold scan.
Definition: ARICHModuleTest.h:388
Belle2::ARICHModuleTest::getDeadCh
int getDeadCh(unsigned int i) const
Return a channel number from the list of dead channels.
Definition: ARICHModuleTest.cc:16
Belle2::ARICHModuleTest::getChipLeak2Dx
TGraph * getChipLeak2Dx(unsigned int i) const
Get leakage current during 2Dx scan.
Definition: ARICHModuleTest.cc:61
Belle2::ARICHModuleTest::m_scanX
TH2D * m_scanX
Laser scan 2D - x direction.
Definition: ARICHModuleTest.h:401
Belle2::ARICHModuleTest::setDeadChs
void setDeadChs(const std::vector< int > &deadChs)
Set vector of dead channel numbers.
Definition: ARICHModuleTest.h:140
Belle2::ARICHModuleTest::setHighVoltage2Dx
void setHighVoltage2Dx(TGraph *HV_2Dx)
Set high voltage during 2Dx scan.
Definition: ARICHModuleTest.h:259
Belle2::ARICHModuleTest::getChipVdiff2Dx
TGraph * getChipVdiff2Dx(unsigned int i) const
Get Chip Vmon - Vset difference during 2Dx scan.
Definition: ARICHModuleTest.cc:50