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Belle II Software
release-05-02-19
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32 class ARICHModuleTest:
public TObject {
double charge(int pdgCode)
Returns electric charge of a particle with given pdg code.
void setChipVdiffTH(unsigned int i, TGraph *chipVdiff_th)
Set Chip Vmon - Vset difference during treshold scan.
TH1F * m_gain
Gain for each channel.
void setChipLeakTH(unsigned int i, TGraph *chipLeak_th)
Set leakage current during treshold scan.
TGraph * m_HV_2Dy
High voltage during 2D y scan.
void setChipVdiff2Dy(unsigned int i, TGraph *chipVdiff_2Dy)
Set Chip Vmon - Vset difference during 2Dx scan.
TH1F * hapd[6]
histogram of hits for each hapd
bool m_isOK
Module is OK if true.
std::string getHapdSN() const
Return HAPD serial number.
void setComment(const std::string &comment)
Set comment.
void setGuardBiasTH(TGraph *guardBias_th)
Set guard bias during treshold scan.
int getStrangeChsSize() const
Return size of the list of strange channels.
TGraph * m_chipVdiff_th[4]
Chip Vmon - Vset difference during treshold scan.
int getFebSN() const
Return FEB serial number.
TGraph * m_chipLeak_2Dy[4]
Chip leakage current during 2D y scan.
void setHighVoltage2Dy(TGraph *HV_2Dy)
Set high voltage during 2Dy scan.
std::string m_comment
Optional comment.
int m_febSN
FEB serial number.
int m_hvbSN
HVB serial number.
void setOK(bool isOK)
Set bool value - module is OK.
void setHighVoltageTH(TGraph *HV_th)
Set high voltage during treshold scan.
TGraph * getChipLeak2Dy(unsigned int i) const
Get leakage current during 2Dy scan.
void setRunPosition(int runposition)
Set module test run.
TGraph * getGuardBiasTH() const
Return guard bias during treshold scan.
void setHvbSN(int serial)
Set HVB serial number.
The Class for ARICH Aerogel Parameters.
int getDeadChsSize() const
Return size of the list of dead channels.
int getRunPosition() const
Return module test run position.
TGraph * getHighVoltage2Dx() const
Return high voltage during 2Dx scan.
TGraph * getGuardBias2Dy() const
Return guard bias during 2Dy scan.
void setGuardBias2Dx(TGraph *guardBias_2Dx)
Set guard bias during 2Dx scan.
TGraph * m_chipVdiff_2Dy[4]
Chip Vmon - Vset difference during 2D y scan.
TGraph * m_chipLeak_2Dx[4]
Chip leakage current during 2D x scan.
TH2D * m_charge
Charge scan 2D.
~ARICHModuleTest()
Destructor.
int getHvbSN() const
Return HVB serial number.
TGraph * m_HV_2Dx
High voltage during 2D x scan.
TH2D * getChargeScan() const
Return charge scan.
void appendDeadCh(int channel)
Add a channel number to the list of dead channels.
TGraph * getHighVoltage2Dy() const
Return high voltage during 2Dy scan.
TGraph * m_HV_th
High voltage during treshold scan.
bool getOK() const
Return True if module is OK.
TH2D * m_scanY
Laser scan 2D - y direction.
TGraph * m_chipVdiff_2Dx[4]
Chip Vmon - Vset difference during 2D x scan.
Abstract base class for different kinds of events.
std::vector< int > m_deadCh
List of dead channels (mapping: channels on HAPD)
std::vector< int > m_strangeCh
List of strange channels (mapping: channels on HAPD)
TGraph * getGuardBias2Dx() const
Return guard bias during 2Dx scan.
void setLaserScanY(TH2D *scanY)
Set laser scan - Y direction.
void setChipLeak2Dx(unsigned int i, TGraph *chipLeak_2Dx)
Set leakage current during 2Dx scan.
std::string m_hapdSN
HAPD serial number.
void setTresholdScan(TH2D *th)
Set treshold scan.
int m_runposition
Position on setup.
void setGuardBias2Dy(TGraph *guardBias_2Dy)
Set guard bias during 2Dy scan.
void setChargeScan(TH2D *charge)
Set charge scan.
TGraph * getChipLeakTH(unsigned int i) const
Get leakage current during treshold scan.
TH2D * getTresholdScan() const
Return treshold scan.
TH1F * getGain() const
Return gain.
int getStrangeCh(unsigned int i) const
Return a channel number from the list of strange channels.
ARICHModuleTest()
Default constructor.
void setGain(TH1F *gain)
Set gain.
TH2D * getLaserScanY() const
Return laser scan - Y direction.
void setFebSN(int serial)
Set FEB serial number.
TH2D * getLaserScanX() const
Return laser scan - X direction.
void setHapdSN(const std::string &hapd)
Set HAPD serial number.
std::string getComment() const
Return comment.
int getRun() const
Return module test run.
TGraph * m_guardBias_2Dy
Guard bias during 2D y scan.
TGraph * m_guardBias_th
Guard bias during treshold scan.
void setChipLeak2Dy(unsigned int i, TGraph *chipLeak_2Dy)
Set leakage current during 2Dy scan.
TGraph * getHighVoltageTH() const
Return high voltage during treshold scan.
void setRun(int run)
Set module test run.
void setLaserScanX(TH2D *scanX)
Set laser scan - X direction.
void appendStrangeCh(int channel)
Add a channel number to the list of strange channels.
ClassDef(ARICHModuleTest, 2)
ClassDef.
TGraph * getChipVdiffTH(unsigned int i) const
Get Chip Vmon - Vset difference during treshold scan.
TGraph * m_guardBias_2Dx
Guard bias during 2D x scan.
void setStrangeChs(const std::vector< int > &strangeChs)
Set vector of strange channel numbers.
TGraph * getChipVdiff2Dy(unsigned int i) const
Get Chip Vmon - Vset difference during 2Dy scan.
TH2D * m_th
Treshold scan 2D.
void setChipVdiff2Dx(unsigned int i, TGraph *chipVdiff_2Dx)
Set Chip Vmon - Vset difference during 2Dx scan.
TGraph * m_chipLeak_th[4]
Chip leakage current during treshold scan.
int getDeadCh(unsigned int i) const
Return a channel number from the list of dead channels.
TGraph * getChipLeak2Dx(unsigned int i) const
Get leakage current during 2Dx scan.
TH2D * m_scanX
Laser scan 2D - x direction.
void setDeadChs(const std::vector< int > &deadChs)
Set vector of dead channel numbers.
void setHighVoltage2Dx(TGraph *HV_2Dx)
Set high voltage during 2Dx scan.
TGraph * getChipVdiff2Dx(unsigned int i) const
Get Chip Vmon - Vset difference during 2Dx scan.