void setChipLeak2Dx(unsigned int i, TGraph *chipLeak_2Dx)
Set leakage current during 2Dx scan.
TH2D * getLaserScanY() const
Get laser scan - Y direction.
std::string m_comment
Optional comment.
void setChipLeak2Dy(unsigned int i, TGraph *chipLeak_2Dy)
Set leakage current during 2Dy scan.
std::vector< int > m_strangeCh
List of strange channels (mapping: channels on HAPD)
TGraph * getHighVoltageTH() const
Get high voltage during treshold scan.
void setChipVdiff2Dy(unsigned int i, TGraph *chipVdiff_2Dy)
Set Chip Vmon - Vset difference during 2Dx scan.
int getStrangeChsSize() const
Get size of the list of strange channels.
TH2D * m_charge
Charge scan 2D.
bool m_isOK
Module is OK if true.
TH1F * m_gain
Gain for each channel.
TH2D * m_scanX
Laser scan 2D - x direction.
int getRunPosition() const
Get module test-run position.
void setGuardBias2Dx(TGraph *guardBias_2Dx)
Set guard bias during 2Dx scan.
std::string getComment() const
Get comment.
TH2D * m_th
Treshold scan 2D.
TGraph * m_chipVdiff_2Dx[4]
Chip Vmon - Vset difference during 2D x scan.
void setChipVdiffTH(unsigned int i, TGraph *chipVdiff_th)
Set Chip Vmon - Vset difference during treshold scan.
TGraph * m_chipLeak_2Dx[4]
Chip leakage current during 2D x scan.
void setHighVoltageTH(TGraph *HV_th)
Set high voltage during treshold scan.
std::string m_hapdSN
HAPD serial number.
int m_runposition
Position on setup.
TGraph * getChipVdiffTH(unsigned int i) const
Get Chip Vmon - Vset difference during treshold scan.
void setLaserScanY(TH2D *scanY)
Set laser scan - Y direction.
TGraph * m_guardBias_th
Guard bias during treshold scan.
int m_febSN
FEB serial number.
TGraph * m_chipVdiff_th[4]
Chip Vmon - Vset difference during treshold scan.
TH2D * getChargeScan() const
Get charge scan.
TGraph * m_chipLeak_2Dy[4]
Chip leakage current during 2D y scan.
TGraph * m_guardBias_2Dy
Guard bias during 2D y scan.
TGraph * getGuardBiasTH() const
Get guard bias during treshold scan.
void setHapdSN(const std::string &hapd)
Set HAPD serial number.
int getRun() const
Get module test run.
TGraph * getHighVoltage2Dy() const
Get high voltage during 2Dy scan.
int getHvbSN() const
Get HVB serial number.
TGraph * m_guardBias_2Dx
Guard bias during 2D x scan.
void setOK(bool isOK)
Set whether module is OK.
TGraph * m_HV_th
High voltage during treshold scan.
TH1F * getGain() const
Get gain.
TGraph * m_HV_2Dx
High voltage during 2D x scan.
ClassDef(ARICHModuleTest, 2)
ClassDef.
TGraph * getChipLeakTH(unsigned int i) const
Get leakage current during treshold scan.
TGraph * getHighVoltage2Dx() const
Get high voltage during 2Dx scan.
TH2D * getTresholdScan() const
Get treshold scan.
void setGuardBias2Dy(TGraph *guardBias_2Dy)
Set guard bias during 2Dy scan.
ARICHModuleTest()
Default constructor.
void setRun(int run)
Set module test run.
TH2D * m_scanY
Laser scan 2D - y direction.
void setHighVoltage2Dy(TGraph *HV_2Dy)
Set high voltage during 2Dy scan.
void setFebSN(int serial)
Set FEB serial number.
TGraph * getGuardBias2Dy() const
Get guard bias during 2Dy scan.
TH2D * getLaserScanX() const
Get laser scan - X direction.
void appendDeadCh(int channel)
Add a channel number to the list of dead channels.
TGraph * m_HV_2Dy
High voltage during 2D y scan.
TGraph * m_chipLeak_th[4]
Chip leakage current during treshold scan.
void setLaserScanX(TH2D *scanX)
Set laser scan - X direction.
int getDeadChsSize() const
Get size of the list of dead channels.
int getFebSN() const
Get FEB serial number.
void setChipLeakTH(unsigned int i, TGraph *chipLeak_th)
Set leakage current during treshold scan.
void setGain(TH1F *gain)
Set gain.
int getDeadCh(unsigned int i) const
Get a channel number from the list of dead channels.
void appendStrangeCh(int channel)
Add a channel number to the list of strange channels.
void setRunPosition(int runposition)
Set module test-run position.
std::vector< int > m_deadCh
List of dead channels (mapping: channels on HAPD)
TGraph * getGuardBias2Dx() const
Get guard bias during 2Dx scan.
TGraph * m_chipVdiff_2Dy[4]
Chip Vmon - Vset difference during 2D y scan.
bool getOK() const
Return true if module is OK.
TGraph * getChipLeak2Dx(unsigned int i) const
Get leakage current during 2Dx scan.
void setDeadChs(const std::vector< int > &deadChs)
Set vector of dead channel numbers.
TGraph * getChipVdiff2Dy(unsigned int i) const
Get Chip Vmon - Vset difference during 2Dy scan.
int m_hvbSN
HVB serial number.
TGraph * getChipVdiff2Dx(unsigned int i) const
Get Chip Vmon - Vset difference during 2Dx scan.
void setHvbSN(int serial)
Set HVB serial number.
void setComment(const std::string &comment)
Set comment.
void setChargeScan(TH2D *charge)
Set charge scan.
void setHighVoltage2Dx(TGraph *HV_2Dx)
Set high voltage during 2Dx scan.
~ARICHModuleTest()
Destructor.
void setTresholdScan(TH2D *th)
Set treshold scan.
TGraph * getChipLeak2Dy(unsigned int i) const
Get leakage current during 2Dy scan.
void setChipVdiff2Dx(unsigned int i, TGraph *chipVdiff_2Dx)
Set Chip Vmon - Vset difference during 2Dx scan.
void setGuardBiasTH(TGraph *guardBias_th)
Set guard bias during treshold scan.
int getStrangeCh(unsigned int i) const
Get a channel number from the list of strange channels.
void setStrangeChs(const std::vector< int > &strangeChs)
Set vector of strange channel numbers.
std::string getHapdSN() const
Get HAPD serial number.
TH1F * hapd[6]
histogram of hits for each hapd
Abstract base class for different kinds of events.