ARICH module test data. More...

#include <ARICHModuleTest.h>

Inheritance diagram for ARICHModuleTest:

Public Member Functions
	ARICHModuleTest ()
	Default constructor.

	~ARICHModuleTest ()
	Destructor.

int	getFebSN () const
	Get FEB serial number.

void	setFebSN (int serial)
	Set FEB serial number.

std::string	getHapdSN () const
	Get HAPD serial number.

void	setHapdSN (const std::string &hapd)
	Set HAPD serial number.

int	getHvbSN () const
	Get HVB serial number.

void	setHvbSN (int serial)
	Set HVB serial number.

int	getRun () const
	Get module test run.

void	setRun (int run)
	Set module test run.

int	getRunPosition () const
	Get module test-run position.

void	setRunPosition (int runposition)
	Set module test-run position.

bool	getOK () const
	Return true if module is OK.

void	setOK (bool isOK)
	Set whether module is OK.

int	getDeadCh (unsigned int i) const
	Get a channel number from the list of dead channels.

void	appendDeadCh (int channel)
	Add a channel number to the list of dead channels.

void	setDeadChs (const std::vector< int > &deadChs)
	Set vector of dead channel numbers.

int	getDeadChsSize () const
	Get size of the list of dead channels.

int	getStrangeCh (unsigned int i) const
	Get a channel number from the list of strange channels.

void	appendStrangeCh (int channel)
	Add a channel number to the list of strange channels.

void	setStrangeChs (const std::vector< int > &strangeChs)
	Set vector of strange channel numbers.

int	getStrangeChsSize () const
	Get size of the list of strange channels.

TGraph *	getGuardBiasTH () const
	Get guard bias during treshold scan.

void	setGuardBiasTH (TGraph *guardBias_th)
	Set guard bias during treshold scan.

TGraph *	getChipVdiffTH (unsigned int i) const
	Get Chip Vmon - Vset difference during treshold scan.

void	setChipVdiffTH (unsigned int i, TGraph *chipVdiff_th)
	Set Chip Vmon - Vset difference during treshold scan.

TGraph *	getChipLeakTH (unsigned int i) const
	Get leakage current during treshold scan.

void	setChipLeakTH (unsigned int i, TGraph *chipLeak_th)
	Set leakage current during treshold scan.

TGraph *	getHighVoltageTH () const
	Get high voltage during treshold scan.

void	setHighVoltageTH (TGraph *HV_th)
	Set high voltage during treshold scan.

TGraph *	getGuardBias2Dx () const
	Get guard bias during 2Dx scan.

void	setGuardBias2Dx (TGraph *guardBias_2Dx)
	Set guard bias during 2Dx scan.

TGraph *	getChipVdiff2Dx (unsigned int i) const
	Get Chip Vmon - Vset difference during 2Dx scan.

void	setChipVdiff2Dx (unsigned int i, TGraph *chipVdiff_2Dx)
	Set Chip Vmon - Vset difference during 2Dx scan.

TGraph *	getChipLeak2Dx (unsigned int i) const
	Get leakage current during 2Dx scan.

void	setChipLeak2Dx (unsigned int i, TGraph *chipLeak_2Dx)
	Set leakage current during 2Dx scan.

TGraph *	getHighVoltage2Dx () const
	Get high voltage during 2Dx scan.

void	setHighVoltage2Dx (TGraph *HV_2Dx)
	Set high voltage during 2Dx scan.

TGraph *	getGuardBias2Dy () const
	Get guard bias during 2Dy scan.

void	setGuardBias2Dy (TGraph *guardBias_2Dy)
	Set guard bias during 2Dy scan.

TGraph *	getChipVdiff2Dy (unsigned int i) const
	Get Chip Vmon - Vset difference during 2Dy scan.

void	setChipVdiff2Dy (unsigned int i, TGraph *chipVdiff_2Dy)
	Set Chip Vmon - Vset difference during 2Dx scan.

TGraph *	getChipLeak2Dy (unsigned int i) const
	Get leakage current during 2Dy scan.

void	setChipLeak2Dy (unsigned int i, TGraph *chipLeak_2Dy)
	Set leakage current during 2Dy scan.

TGraph *	getHighVoltage2Dy () const
	Get high voltage during 2Dy scan.

void	setHighVoltage2Dy (TGraph *HV_2Dy)
	Set high voltage during 2Dy scan.

TH1F *	getGain () const
	Get gain.

void	setGain (TH1F *gain)
	Set gain.

TH2D *	getChargeScan () const
	Get charge scan.

void	setChargeScan (TH2D *charge)
	Set charge scan.

TH2D *	getTresholdScan () const
	Get treshold scan.

void	setTresholdScan (TH2D *th)
	Set treshold scan.

TH2D *	getLaserScanX () const
	Get laser scan - X direction.

void	setLaserScanX (TH2D *scanX)
	Set laser scan - X direction.

TH2D *	getLaserScanY () const
	Get laser scan - Y direction.

void	setLaserScanY (TH2D *scanY)
	Set laser scan - Y direction.

std::string	getComment () const
	Get comment.

void	setComment (const std::string &comment)
	Set comment.

Private Member Functions
	ClassDef (ARICHModuleTest, 2)
	ClassDef.

Private Attributes
int	m_febSN
	FEB serial number.

std::string	m_hapdSN
	HAPD serial number.

int	m_hvbSN
	HVB serial number.

int	m_run
	Run number.

int	m_runposition
	Position on setup.

bool	m_isOK
	Module is OK if true.

std::vector< int >	m_deadCh
	List of dead channels (mapping: channels on HAPD)

std::vector< int >	m_strangeCh
	List of strange channels (mapping: channels on HAPD)

TGraph *	m_guardBias_th
	Guard bias during treshold scan.

TGraph *	m_chipVdiff_th [4]
	Chip Vmon - Vset difference during treshold scan.

TGraph *	m_chipLeak_th [4]
	Chip leakage current during treshold scan.

TGraph *	m_HV_th
	High voltage during treshold scan.

TGraph *	m_guardBias_2Dx
	Guard bias during 2D x scan.

TGraph *	m_chipVdiff_2Dx [4]
	Chip Vmon - Vset difference during 2D x scan.

TGraph *	m_chipLeak_2Dx [4]
	Chip leakage current during 2D x scan.

TGraph *	m_HV_2Dx
	High voltage during 2D x scan.

TGraph *	m_guardBias_2Dy
	Guard bias during 2D y scan.

TGraph *	m_chipVdiff_2Dy [4]
	Chip Vmon - Vset difference during 2D y scan.

TGraph *	m_chipLeak_2Dy [4]
	Chip leakage current during 2D y scan.

TGraph *	m_HV_2Dy
	High voltage during 2D y scan.

TH1F *	m_gain
	Gain for each channel.

TH2D *	m_charge
	Charge scan 2D.

TH2D *	m_th
	Treshold scan 2D.

TH2D *	m_scanX
	Laser scan 2D - x direction.

TH2D *	m_scanY
	Laser scan 2D - y direction.

std::string	m_comment
	Optional comment.

Detailed Description

ARICH module test data.

Definition at line 29 of file ARICHModuleTest.h.

Constructor & Destructor Documentation

◆ ARICHModuleTest()

ARICHModuleTest ( )

inline

Default constructor.

Definition at line 35 of file ARICHModuleTest.h.

                     : m_febSN(0), m_hapdSN(""), m_hvbSN(0), m_run(0), m_runposition(0), m_isOK(false), m_deadCh(), m_strangeCh(),
      m_guardBias_th(NULL), m_HV_th(NULL), m_guardBias_2Dx(NULL), m_HV_2Dx(NULL), m_guardBias_2Dy(NULL), m_HV_2Dy(NULL), m_gain(NULL),
      m_charge(NULL), m_th(NULL), m_scanX(NULL), m_scanY(NULL), m_comment("")
    {
      for (unsigned i = 0; i < 4; i++) m_chipVdiff_th[i] = NULL;
      for (unsigned i = 0; i < 4; i++) m_chipLeak_th[i] = NULL;
      for (unsigned i = 0; i < 4; i++) m_chipVdiff_2Dx[i] = NULL;
      for (unsigned i = 0; i < 4; i++) m_chipLeak_2Dx[i] = NULL;
      for (unsigned i = 0; i < 4; i++) m_chipVdiff_2Dy[i] = NULL;
      for (unsigned i = 0; i < 4; i++) m_chipLeak_2Dy[i] = NULL;
    };

◆ ~ARICHModuleTest()

~ARICHModuleTest ( )

inline

Destructor.

Definition at line 50 of file ARICHModuleTest.h.

50{};

Member Function Documentation

◆ appendDeadCh()

void appendDeadCh ( int channel )

inline

Add a channel number to the list of dead channels.

Parameters

[in] channel HAPD channel id.

Definition at line 135 of file ARICHModuleTest.h.

135{m_deadCh.push_back(channel); }

◆ appendStrangeCh()

void appendStrangeCh ( int channel )

inline

Add a channel number to the list of strange channels.

Parameters

[in] channel HAPD channel id.

Definition at line 160 of file ARICHModuleTest.h.

160{m_strangeCh.push_back(channel); }

◆ getChargeScan()

TH2D * getChargeScan ( ) const

inline

Get charge scan.

Returns: Charge scan.

Definition at line 340 of file ARICHModuleTest.h.

340{return m_charge;}

◆ getChipLeak2Dx()

TGraph * getChipLeak2Dx ( unsigned int i ) const

Get leakage current during 2Dx scan.

Returns: Leakage current.

Definition at line 59 of file ARICHModuleTest.cc.

{
  if (i < 4) return m_chipLeak_2Dx[i];
  else return NULL;
}

◆ getChipLeak2Dy()

TGraph * getChipLeak2Dy ( unsigned int i ) const

Get leakage current during 2Dy scan.

Returns: Leakage current.

Definition at line 81 of file ARICHModuleTest.cc.

{
  if (i < 4) return m_chipLeak_2Dy[i];
  else return NULL;
}

◆ getChipLeakTH()

TGraph * getChipLeakTH ( unsigned int i ) const

Get leakage current during treshold scan.

Returns: Leakage current.

Definition at line 37 of file ARICHModuleTest.cc.

{
  if (i < 4) return m_chipLeak_th[i];
  else return NULL;
}

◆ getChipVdiff2Dx()

TGraph * getChipVdiff2Dx ( unsigned int i ) const

Get Chip Vmon - Vset difference during 2Dx scan.

Returns: Chip Vmon - Vset difference.

Definition at line 48 of file ARICHModuleTest.cc.

{
  if (i < 4) return m_chipVdiff_2Dx[i];
  else return NULL;
}

◆ getChipVdiff2Dy()

TGraph * getChipVdiff2Dy ( unsigned int i ) const

Get Chip Vmon - Vset difference during 2Dy scan.

Returns: Chip Vmon - Vset difference.

Definition at line 70 of file ARICHModuleTest.cc.

{
  if (i < 4) return m_chipVdiff_2Dy[i];
  else return NULL;
}

◆ getChipVdiffTH()

TGraph * getChipVdiffTH ( unsigned int i ) const

Get Chip Vmon - Vset difference during treshold scan.

Returns: Chip Vmon - Vset difference

Definition at line 26 of file ARICHModuleTest.cc.

{
  if (i < 4) return m_chipVdiff_th[i];
  else return NULL;
}

◆ getComment()

std::string getComment ( ) const

inline

Get comment.

Returns: Comment.

Definition at line 388 of file ARICHModuleTest.h.

388{return m_comment; }

◆ getDeadCh()

int getDeadCh ( unsigned int i ) const

Get a channel number from the list of dead channels.

Parameters

[in] i Index of the element in the list.

Returns: HAPD channel id.

Definition at line 14 of file ARICHModuleTest.cc.

{
  if (i < m_deadCh.size()) return m_deadCh[i];
  else return 0;
}

◆ getDeadChsSize()

int getDeadChsSize ( ) const

inline

Get size of the list of dead channels.

Returns: Size.

Definition at line 147 of file ARICHModuleTest.h.

147{return m_deadCh.size();}

◆ getFebSN()

int getFebSN ( ) const

inline

Get FEB serial number.

Returns: FEB serial number.

Definition at line 56 of file ARICHModuleTest.h.

56{return m_febSN; }

◆ getGain()

TH1F * getGain ( ) const

inline

Get gain.

Returns: Gain.

Definition at line 328 of file ARICHModuleTest.h.

328{return m_gain;}

◆ getGuardBias2Dx()

TGraph * getGuardBias2Dx ( ) const

inline

Get guard bias during 2Dx scan.

Returns: TGraph guard bias during 2Dx scan.

Definition at line 228 of file ARICHModuleTest.h.

228{return m_guardBias_2Dx;}

◆ getGuardBias2Dy()

TGraph * getGuardBias2Dy ( ) const

inline

Get guard bias during 2Dy scan.

Returns: TGraph guard bias during 2Dy scan.

Definition at line 278 of file ARICHModuleTest.h.

278{return m_guardBias_2Dy;}

◆ getGuardBiasTH()

TGraph * getGuardBiasTH ( ) const

inline

Get guard bias during treshold scan.

Returns: TGraph guard bias during treshold scan.

Definition at line 178 of file ARICHModuleTest.h.

178{return m_guardBias_th;}

◆ getHapdSN()

std::string getHapdSN ( ) const

inline

Get HAPD serial number.

Returns: HAPD serial number.

Definition at line 68 of file ARICHModuleTest.h.

68{return m_hapdSN; }

◆ getHighVoltage2Dx()

TGraph * getHighVoltage2Dx ( ) const

inline

Get high voltage during 2Dx scan.

Returns: TGraph high voltage during 2Dx scan.

Definition at line 266 of file ARICHModuleTest.h.

266{return m_HV_2Dx;}

◆ getHighVoltage2Dy()

TGraph * getHighVoltage2Dy ( ) const

inline

Get high voltage during 2Dy scan.

Returns: TGraph high voltage 2Dy scan.

Definition at line 316 of file ARICHModuleTest.h.

316{return m_HV_2Dy;}

◆ getHighVoltageTH()

TGraph * getHighVoltageTH ( ) const

inline

Get high voltage during treshold scan.

Returns: TGraph high voltage during treshold scan.

Definition at line 216 of file ARICHModuleTest.h.

216{return m_HV_th;}

◆ getHvbSN()

int getHvbSN ( ) const

inline

Get HVB serial number.

Returns: HVB serial number.

Definition at line 80 of file ARICHModuleTest.h.

80{return m_hvbSN; }

◆ getLaserScanX()

TH2D * getLaserScanX ( ) const

inline

Get laser scan - X direction.

Returns: Laser scan - X direction.

Definition at line 364 of file ARICHModuleTest.h.

364{return m_scanX;}

◆ getLaserScanY()

TH2D * getLaserScanY ( ) const

inline

Get laser scan - Y direction.

Returns: Laser scan - Y direction.

Definition at line 376 of file ARICHModuleTest.h.

376{return m_scanY;}

◆ getOK()

bool getOK ( ) const

inline

Return true if module is OK.

Returns: True if module is OK.

Definition at line 116 of file ARICHModuleTest.h.

116{return m_isOK; }

◆ getRun()

int getRun ( ) const

inline

Get module test run.

Returns: Nodule test run.

Definition at line 92 of file ARICHModuleTest.h.

92{return m_run; }

◆ getRunPosition()

int getRunPosition ( ) const

inline

Get module test-run position.

Returns: Module test-run position.

Definition at line 104 of file ARICHModuleTest.h.

104{return m_runposition; }

◆ getStrangeCh()

int getStrangeCh ( unsigned int i ) const

Get a channel number from the list of strange channels.

Parameters

[in] i Index of the element in the list.

Returns: HAPD channel id.

Definition at line 20 of file ARICHModuleTest.cc.

{
  if (i < m_deadCh.size()) return m_deadCh[i];
  else return 0;
}

◆ getStrangeChsSize()

int getStrangeChsSize ( ) const

inline

Get size of the list of strange channels.

Returns: Size.

Definition at line 172 of file ARICHModuleTest.h.

172{return m_strangeCh.size();}

◆ getTresholdScan()

TH2D * getTresholdScan ( ) const

inline

Get treshold scan.

Returns: Treshold scan.

Definition at line 352 of file ARICHModuleTest.h.

352{return m_th;}

◆ setChargeScan()

void setChargeScan ( TH2D * charge )

inline

Set charge scan.

Parameters

[in] charge Charge scan.

Definition at line 346 of file ARICHModuleTest.h.

346{ m_charge = charge;}

Belle2::EvtPDLUtil::charge

double charge(int pdgCode)

Returns electric charge of a particle with given pdg code.

Definition: EvtPDLUtil.cc:44

◆ setChipLeak2Dx()

void setChipLeak2Dx	(	unsigned int	i,
		TGraph *	chipLeak_2Dx
	)

Set leakage current during 2Dx scan.

Parameters

[in]	i	chip id
[in]	chipLeak_2Dx	Leakage current.

Definition at line 65 of file ARICHModuleTest.cc.

{
  if (i < 4) m_chipLeak_2Dx[i] = chipLeak_2Dx;
}

◆ setChipLeak2Dy()

void setChipLeak2Dy	(	unsigned int	i,
		TGraph *	chipLeak_2Dy
	)

Set leakage current during 2Dy scan.

Parameters

[in]	i	chip id
[in]	chipLeak_2Dy	Leakage current.

Definition at line 87 of file ARICHModuleTest.cc.

{
  if (i < 4) m_chipLeak_2Dy[i] = chipLeak_2Dy;
}

◆ setChipLeakTH()

void setChipLeakTH	(	unsigned int	i,
		TGraph *	chipLeak_th
	)

Set leakage current during treshold scan.

Parameters

[in]	i	chip id
[in]	chipLeak_th	Leakage current.

Definition at line 43 of file ARICHModuleTest.cc.

{
  if (i < 4) m_chipLeak_th[i] = chipLeak_th;
}

◆ setChipVdiff2Dx()

void setChipVdiff2Dx	(	unsigned int	i,
		TGraph *	chipVdiff_2Dx
	)

Set Chip Vmon - Vset difference during 2Dx scan.

Parameters

[in]	i	chip id
[in]	chipVdiff_2Dx	Chip Vmon - Vset difference.

Definition at line 54 of file ARICHModuleTest.cc.

{
  if (i < 4) m_chipVdiff_2Dx[i] = chipVdiff_2Dx;
}

◆ setChipVdiff2Dy()

void setChipVdiff2Dy	(	unsigned int	i,
		TGraph *	chipVdiff_2Dy
	)

Set Chip Vmon - Vset difference during 2Dx scan.

Parameters

[in]	i	chip id
[in]	chipVdiff_2Dy	Chip Vmon - Vset difference.

Definition at line 76 of file ARICHModuleTest.cc.

{
  if (i < 4) m_chipVdiff_2Dy[i] = chipVdiff_2Dy;
}

◆ setChipVdiffTH()

void setChipVdiffTH	(	unsigned int	i,
		TGraph *	chipVdiff_th
	)

Set Chip Vmon - Vset difference during treshold scan.

Parameters

[in]	i	chip id
[in]	chipVdiff_th	Chip Vmon - Vset difference.

Definition at line 32 of file ARICHModuleTest.cc.

{
  if (i < 4) m_chipVdiff_th[i] = chipVdiff_th;
}

◆ setComment()

void setComment ( const std::string & comment )

inline

Set comment.

Parameters

[in] comment Comment.

Definition at line 394 of file ARICHModuleTest.h.

394{m_comment = comment; }

◆ setDeadChs()

void setDeadChs ( const std::vector< int > & deadChs )

inline

Set vector of dead channel numbers.

Parameters

[in] deadChs HAPD channel id.

Definition at line 141 of file ARICHModuleTest.h.

141{m_deadCh = deadChs; }

◆ setFebSN()

void setFebSN ( int serial )

inline

Set FEB serial number.

Parameters

[in] serial FEB serial number.

Definition at line 62 of file ARICHModuleTest.h.

62{m_febSN = serial; }

◆ setGain()

void setGain ( TH1F * gain )

inline

Set gain.

Parameters

[in] gain Gain.

Definition at line 334 of file ARICHModuleTest.h.

334{ m_gain = gain;}

◆ setGuardBias2Dx()

void setGuardBias2Dx ( TGraph * guardBias_2Dx )

inline

Set guard bias during 2Dx scan.

Parameters

[in] guardBias_2Dx TGraph guard bias during 2Dx scan.

Definition at line 234 of file ARICHModuleTest.h.

234{ m_guardBias_2Dx = guardBias_2Dx;}

◆ setGuardBias2Dy()

void setGuardBias2Dy ( TGraph * guardBias_2Dy )

inline

Set guard bias during 2Dy scan.

Parameters

[in] guardBias_2Dy TGraph guard bias during 2Dy scan.

Definition at line 284 of file ARICHModuleTest.h.

284{ m_guardBias_2Dy = guardBias_2Dy;}

◆ setGuardBiasTH()

void setGuardBiasTH ( TGraph * guardBias_th )

inline

Set guard bias during treshold scan.

Parameters

[in] guardBias_th TGraph guard bias during treshold scan.

Definition at line 184 of file ARICHModuleTest.h.

184{ m_guardBias_th = guardBias_th;}

◆ setHapdSN()

void setHapdSN ( const std::string & hapd )

inline

Set HAPD serial number.

Parameters

[in] hapd HAPD serial number.

Definition at line 74 of file ARICHModuleTest.h.

74{m_hapdSN = hapd; }

Belle2::hapd

TH1F * hapd[6]

histogram of hits for each hapd

Definition: arichBtestModule.cc:82

◆ setHighVoltage2Dx()

void setHighVoltage2Dx ( TGraph * HV_2Dx )

inline

Set high voltage during 2Dx scan.

Parameters

[in] HV_2Dx TGraph high voltage during 2Dx scan.

Definition at line 272 of file ARICHModuleTest.h.

272{ m_HV_2Dx = HV_2Dx;}

◆ setHighVoltage2Dy()

void setHighVoltage2Dy ( TGraph * HV_2Dy )

inline

Set high voltage during 2Dy scan.

Parameters

[in] HV_2Dy TGraph high voltage 2Dy scan.

Definition at line 322 of file ARICHModuleTest.h.

322{ m_HV_2Dy = HV_2Dy;}

◆ setHighVoltageTH()

void setHighVoltageTH ( TGraph * HV_th )

inline

Set high voltage during treshold scan.

Parameters

[in] HV_th TGraph high voltage during treshold scan.

Definition at line 222 of file ARICHModuleTest.h.

222{ m_HV_th = HV_th;}

◆ setHvbSN()

void setHvbSN ( int serial )

inline

Set HVB serial number.

Parameters

[in] serial HVB serial number.

Definition at line 86 of file ARICHModuleTest.h.

86{m_hvbSN = serial; }

◆ setLaserScanX()

void setLaserScanX ( TH2D * scanX )

inline

Set laser scan - X direction.

Parameters

[in] scanX Laser scan - X direction.

Definition at line 370 of file ARICHModuleTest.h.

370{ m_scanX = scanX;}

◆ setLaserScanY()

void setLaserScanY ( TH2D * scanY )

inline

Set laser scan - Y direction.

Parameters

[in] scanY Laser scan - Y direction.

Definition at line 382 of file ARICHModuleTest.h.

382{ m_scanY = scanY;}

◆ setOK()

void setOK ( bool isOK )

inline

Set whether module is OK.

Parameters

[in] isOK Module is OK.

Definition at line 122 of file ARICHModuleTest.h.

122{m_isOK = isOK; }

◆ setRun()

void setRun ( int run )

inline

Set module test run.

Parameters

[in] run Module test run.

Definition at line 98 of file ARICHModuleTest.h.

98{m_run = run; }

◆ setRunPosition()

void setRunPosition ( int runposition )

inline

Set module test-run position.

Parameters

[in] runposition Module test-run position.

Definition at line 110 of file ARICHModuleTest.h.

110{m_runposition = runposition; }

◆ setStrangeChs()

void setStrangeChs ( const std::vector< int > & strangeChs )

inline

Set vector of strange channel numbers.

Parameters

[in] strangeChs HAPD channel id.

Definition at line 166 of file ARICHModuleTest.h.

166{m_strangeCh = strangeChs; }

◆ setTresholdScan()

void setTresholdScan ( TH2D * th )

inline

Set treshold scan.

Parameters

[in] th Treshold scan.

Definition at line 358 of file ARICHModuleTest.h.

358{ m_th = th;}

Member Data Documentation

◆ m_charge

TH2D* m_charge

private

Charge scan 2D.

Definition at line 420 of file ARICHModuleTest.h.

◆ m_chipLeak_2Dx

TGraph* m_chipLeak_2Dx[4]

private

Chip leakage current during 2D x scan.

Definition at line 413 of file ARICHModuleTest.h.

◆ m_chipLeak_2Dy

TGraph* m_chipLeak_2Dy[4]

private

Chip leakage current during 2D y scan.

Definition at line 417 of file ARICHModuleTest.h.

◆ m_chipLeak_th

TGraph* m_chipLeak_th[4]

private

Chip leakage current during treshold scan.

Definition at line 409 of file ARICHModuleTest.h.

◆ m_chipVdiff_2Dx

TGraph* m_chipVdiff_2Dx[4]

private

Chip Vmon - Vset difference during 2D x scan.

Definition at line 412 of file ARICHModuleTest.h.

◆ m_chipVdiff_2Dy

TGraph* m_chipVdiff_2Dy[4]

private

Chip Vmon - Vset difference during 2D y scan.

Definition at line 416 of file ARICHModuleTest.h.

◆ m_chipVdiff_th

TGraph* m_chipVdiff_th[4]

private

Chip Vmon - Vset difference during treshold scan.

Definition at line 408 of file ARICHModuleTest.h.

◆ m_comment

std::string m_comment

private

Optional comment.

Definition at line 425 of file ARICHModuleTest.h.

◆ m_deadCh

std::vector<int> m_deadCh

private

List of dead channels (mapping: channels on HAPD)

Definition at line 404 of file ARICHModuleTest.h.

◆ m_febSN

int m_febSN

private

FEB serial number.

Definition at line 398 of file ARICHModuleTest.h.

◆ m_gain

TH1F* m_gain

private

Gain for each channel.

Definition at line 419 of file ARICHModuleTest.h.

◆ m_guardBias_2Dx

TGraph* m_guardBias_2Dx

private

Guard bias during 2D x scan.

Definition at line 411 of file ARICHModuleTest.h.

◆ m_guardBias_2Dy

TGraph* m_guardBias_2Dy

private

Guard bias during 2D y scan.

Definition at line 415 of file ARICHModuleTest.h.

◆ m_guardBias_th

TGraph* m_guardBias_th

private

Guard bias during treshold scan.

Definition at line 407 of file ARICHModuleTest.h.

◆ m_hapdSN

std::string m_hapdSN

private

HAPD serial number.

Definition at line 399 of file ARICHModuleTest.h.

◆ m_HV_2Dx

TGraph* m_HV_2Dx

private

High voltage during 2D x scan.

Definition at line 414 of file ARICHModuleTest.h.

◆ m_HV_2Dy

TGraph* m_HV_2Dy

private

High voltage during 2D y scan.

Definition at line 418 of file ARICHModuleTest.h.

◆ m_HV_th

TGraph* m_HV_th

private

High voltage during treshold scan.

Definition at line 410 of file ARICHModuleTest.h.

◆ m_hvbSN

int m_hvbSN

private

HVB serial number.

Definition at line 400 of file ARICHModuleTest.h.

◆ m_isOK

bool m_isOK

private

Module is OK if true.

Definition at line 403 of file ARICHModuleTest.h.

◆ m_run

int m_run

private

Run number.

Definition at line 401 of file ARICHModuleTest.h.

◆ m_runposition

int m_runposition

private

Position on setup.

Definition at line 402 of file ARICHModuleTest.h.

◆ m_scanX

TH2D* m_scanX

private

Laser scan 2D - x direction.

Definition at line 422 of file ARICHModuleTest.h.

◆ m_scanY

TH2D* m_scanY

private

Laser scan 2D - y direction.

Definition at line 423 of file ARICHModuleTest.h.

◆ m_strangeCh

std::vector<int> m_strangeCh

private

List of strange channels (mapping: channels on HAPD)

Definition at line 405 of file ARICHModuleTest.h.

◆ m_th

TH2D* m_th

private

Treshold scan 2D.

Definition at line 421 of file ARICHModuleTest.h.

The documentation for this class was generated from the following files:

arich/dbobjects/include/ARICHModuleTest.h
arich/dbobjects/src/ARICHModuleTest.cc

Public Member Functions

Private Member Functions

Private Attributes

Detailed Description

Constructor & Destructor Documentation

◆ ARICHModuleTest()

◆ ~ARICHModuleTest()

Member Function Documentation

◆ appendDeadCh()

◆ appendStrangeCh()

◆ getChargeScan()

◆ getChipLeak2Dx()

◆ getChipLeak2Dy()

◆ getChipLeakTH()

◆ getChipVdiff2Dx()

◆ getChipVdiff2Dy()

◆ getChipVdiffTH()

◆ getComment()

◆ getDeadCh()

◆ getDeadChsSize()

◆ getFebSN()

◆ getGain()

◆ getGuardBias2Dx()

◆ getGuardBias2Dy()

◆ getGuardBiasTH()

◆ getHapdSN()

◆ getHighVoltage2Dx()

◆ getHighVoltage2Dy()

◆ getHighVoltageTH()

◆ getHvbSN()

◆ getLaserScanX()

◆ getLaserScanY()

◆ getOK()

◆ getRun()

◆ getRunPosition()

◆ getStrangeCh()

◆ getStrangeChsSize()

◆ getTresholdScan()

◆ setChargeScan()

◆ setChipLeak2Dx()

◆ setChipLeak2Dy()

◆ setChipLeakTH()

◆ setChipVdiff2Dx()

◆ setChipVdiff2Dy()

◆ setChipVdiffTH()

◆ setComment()

◆ setDeadChs()

◆ setFebSN()

◆ setGain()

◆ setGuardBias2Dx()

◆ setGuardBias2Dy()

◆ setGuardBiasTH()

◆ setHapdSN()

◆ setHighVoltage2Dx()

◆ setHighVoltage2Dy()

◆ setHighVoltageTH()

◆ setHvbSN()

◆ setLaserScanX()

◆ setLaserScanY()

◆ setOK()

◆ setRun()

◆ setRunPosition()

◆ setStrangeChs()

◆ setTresholdScan()

Member Data Documentation

◆ m_charge

◆ m_chipLeak_2Dx

◆ m_chipLeak_2Dy

◆ m_chipLeak_th

◆ m_chipVdiff_2Dx

◆ m_chipVdiff_2Dy

◆ m_chipVdiff_th

◆ m_comment

◆ m_deadCh

◆ m_febSN

◆ m_gain

◆ m_guardBias_2Dx

◆ m_guardBias_2Dy

◆ m_guardBias_th

◆ m_hapdSN